"Microscopy, Atomic Force" is a descriptor in the National Library of Medicine's controlled vocabulary thesaurus,
MeSH (Medical Subject Headings). Descriptors are arranged in a hierarchical structure,
which enables searching at various levels of specificity.
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
| Descriptor ID |
D018625
|
| MeSH Number(s) |
E01.370.350.515.666.400 E05.595.666.400
|
| Concept/Terms |
Microscopy, Atomic Force- Microscopy, Atomic Force
- Force Microscopy
- Force Microscopies
- Microscopies, Force
- Microscopy, Force
- Scanning Force Microscopy
- Force Microscopies, Scanning
- Force Microscopy, Scanning
- Microscopies, Scanning Force
- Microscopy, Scanning Force
- Scanning Force Microscopies
- Atomic Force Microscopy
- Atomic Force Microscopies
- Microscopies, Atomic Force
|
Below are MeSH descriptors whose meaning is more general than "Microscopy, Atomic Force".
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Below are the most recent publications written about "Microscopy, Atomic Force" by people in Profiles.